MessLeha

Selecting the right semiconductor is a crucial step during the development of a power electronic system. Semiconductors are characterized using the measurement methods and environments defined in the IEC 60747 series on semiconductor devices. However, gaps in these standards impede the traceability and, therefore, the comparability of measurement results. Furthermore, the application of these standards is limited when it comes to new technologies like SiC and GaN, which reach significantly higher switching speeds.

Furthermore, setting up a simulation during the selection process is often laborious on the customer side. Semiconductor manufacturers have to decide which of the many available simulation tools they want to model. If their customers use a different tool from the ones they have selected, then parametrization will require considerable effort.

The project MessLeha addresses these issues by developing a modular characterization setup for measuring fast power semiconductors. The project will also define a machine-readable data sheet to support the setup of simulation models.

To achieve this, the currently specified measurement environment will be analyzed, regarding the traceability of measurement results using reference designs. Subsequently, an improved measurement setup will be developed. For the machine-readable data sheet a data set will be defined that allows for the parametrization of all common simulation models.

Furthermore, the partners will compare several measurement principles for determining switching losses for fast semiconductors. They will also advance the sensor technology for the Double Pulse Test, which is used to determine switching losses, to make it suitable for novel device generations.

Based on the project results, two drafts for international standardization will be developed.

The project MessLeha aims for the two standard drafts to be proposed to IEC. The first proposal is an amendment to the standards IEC 60747-8, -9, and -15 and will address the current lack of traceability of measurements. It will furthermore make sure that the Double Pulse Test will also be applicable to the new SiC and GaN semiconductors. The second proposal will define the machine-readable data sheet which will be useable in all simulation tools and enable the comparability of components based on the data sheet values.